|Method||Scanning Electron Microscopy utilising Energy Dispersive X-ray detection (SEM-EDX)|
The technique has many potential applications in fault finding, metallurgical analysis and debris characterisation.
The mapping software effectively treats each pixel in the SEM micrograph image as an individual EDX spectrum, determining the full elemental composition of the area being scanned.
In maximum resolution, a single image can be comprised of over a quarter of a million individual EDX scans.
The EDX map provides us with valuable information about the elemental distribution throughout the sample being analysed, whatever it is.
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