Here at Monition, we do wear particle analysis a little differently to most labs.
Whilst wear particle analysis is traditionally a purely visual technique combining light microscopy and visual partial analysis, we prefer the much more cutting edge technique of Scanning Electron Microscopy with an in-built elemental detector (SEM-EDX).
SEM-EDX doesn’t just allow you to measure the size and morphology (shape) of a wear debris particles extracted from either a lubricant or a filter, but it also allows us to examine the elemental makeup of these particles, thus merging chemical and physical wear analysis into one highly effective test method.
The added benefit of this methodology is the ability to examine wear particles literally thousands of times smaller than optical microscopy can achieve.
The outcome – an extensive report on the identity, size, shape and makeup of the particles, making isolating the source a much simpler task, and making unforeseen downtime a much less likely occurrence.